WD XRF Explained Measuring Elements Sequentially

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Discover how sequential WD-XRF systems measure elements one by one. We explain the process involving X-ray tubes, sample fluorescence, crystals, and detectors for precise elemental analysis.
[10:35-10:43]
this is how we get the sequential WD-XRF name that we measure one element after another with this system set up.
[09:52-10:24]
So we have our X-ray tube, the primary beam, and, um, then the X-rays are fluoresced off the surface of our sample. They move through a slit and then bounce off of a crystal. And as I said before on the previous slide, X-rays coming from the sample diffract with different wavelengths in different directions. So in a sequential WD-XRF tool, we can move the crystals to select the element wavelength that we want to capture, and then we also move the detector.
[10:24-10:43]
The detector is on a goniometer, and then it's able to move through different 2 thetas to collect intensities of different wavelengths of different elements. So this is how we get the sequential WD-XRF name that we measure one element after another with this system set up.

Видео WD XRF Explained Measuring Elements Sequentially канала Rigaku Corporation