OmniScan MX: New Developments and Upgrades

Omniscan MX ECA/ECT details: http://bit.ly/1gMDsh1

The new developments for the OmniScan MX ECA/ECT flaw detector includes an Eddy Current Array Module and the new MXE 3.0 Eddy Current Array Software. These developments have reinvented surface, subsurface, and Bond Test inspection for a range of applications within the aerospace, automotive, and manufacturing industries.

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