High-Resolution Materials Analysis at TAU.nano

TAU.nano provides Israel’s most comprehensive nanotechnology characterization infrastructure under one roof. With access to high-end instruments like HR-SEM, DualBeam FIB/SEM, TEM with EELS and EDS, XPS with depth profiling, and advanced AFM techniques, the center enables researchers and engineers to perform full nanoscale analysis of materials, surfaces, interfaces, and thin films.

Whether you're developing semiconductor devices, optimizing deposition processes, or evaluating new nanomaterials, the center offers precise, industry-standard diagnostics — including topographical, mechanical, structural, and chemical characterization — supported by expert staff. TAU.nano is open to academic and industrial users, offering both independent access and full-service analytical support.

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Видео High-Resolution Materials Analysis at TAU.nano канала Tel Aviv University Center for Nanotechnology