AFM with Nanoprobers for Electrical Characterization | FusionScope®

FusionScope® provides an atomic force microscopy (AFM) environment integrated with nanoprober technology, enabling precise, localized electrical characterization.

Use Profile View to control the position of nanoprobers with nanometer precision, then perform localized measurements, without needing to gold coat samples.

From failure analysis to semiconductor device validation and materials characterization, FusionScope gives you a fully correlated and more efficient workflow, without the hassle of moving your sample between systems.

Meet our microscopy experts and experience FusionScope in action at Booth 1109 during Microscopy & Microanalysis 2025 in Salt Lake City, Utah, from July 27–31.

For more information, visit our website: https://fusionscope.com/?utm_source=linkedin&utm_medium=social&utm_campaign=mm25.

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Видео AFM with Nanoprobers for Electrical Characterization | FusionScope® канала Quantum Design USA