PM+CS Summit 2021: The Challenges of Measuring Persistent Memory Performance

With multiple types of persistent memory in the market today, and many more potentially coming in the future, defining a way to consistently measure performance can be a challenge. The SNIA Solid State Storage (S3) Technical Work Group (TWG) has undertaken an effort to define and test persistent memory, both in drive and raw memory format. The most recent effort is the Performance Test Specification (PTS). This talk will discuss the test and cover: Test Methodology; platform setup; synthetic and real-world workloads; and reporting format for test results. The PTS will enable an understand of both block and byte-addressable memory performance for accurate comparison in the real world.

Presented by:
Eduardo Berrocal, Sr. Software Engineer
Intel Corporation

Keith Orsak, Master Technologist, Sustaining Storage Products
Hewlett Packard Enterprise

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