What is optical emission spectroscopy (OES)? | OES explained
Optical emission spectroscopy, or OES, is a well trusted and widely used analytical technique used to determine the elemental composition of a broad range of metals.
OES can analyze a wide range of elements from hydrogen to uranium in solid metal examples covering a wide concentration range, giving very high accuracy, high precision and low detection limits. The elements and concentrations that OES analyzers can determine depend on the material being tested and the type of analyzer used.
Compared to other analytical techniques, OES has many advantages: it’s fast and relatively easy to use, it measures a wide range of elements and concentrations in many different types of materials, including important elements such as carbon, sulfur, phosphorous, boron and nitrogen. It’s extremely accurate when measuring low levels of trace and tramp elements, and it’s low-cost.
Discover more about what is OES: https://hhtas.net/3xGHNNU
Find out more about Hitachi’s OES product range: https://hhtas.net/3QLQ4ca
Видео What is optical emission spectroscopy (OES)? | OES explained канала Hitachi High-Tech GlobalTV
OES can analyze a wide range of elements from hydrogen to uranium in solid metal examples covering a wide concentration range, giving very high accuracy, high precision and low detection limits. The elements and concentrations that OES analyzers can determine depend on the material being tested and the type of analyzer used.
Compared to other analytical techniques, OES has many advantages: it’s fast and relatively easy to use, it measures a wide range of elements and concentrations in many different types of materials, including important elements such as carbon, sulfur, phosphorous, boron and nitrogen. It’s extremely accurate when measuring low levels of trace and tramp elements, and it’s low-cost.
Discover more about what is OES: https://hhtas.net/3xGHNNU
Find out more about Hitachi’s OES product range: https://hhtas.net/3QLQ4ca
Видео What is optical emission spectroscopy (OES)? | OES explained канала Hitachi High-Tech GlobalTV
Показать
Комментарии отсутствуют
Информация о видео
Другие видео канала
Tutorial | Mobile OES | How to clean the spark probeTutorial | X-MET8000 | How to prepare the secondary safety windowTutorial | Stationary OES | How to turn on/off and flush your instrumentCustomer story| IWT Solutions | Using PMI-MASTER Smart for component safety and regulation creationTutorial | X-MET8000 | How to set up the light standLAB-X5000 | Benchtop XRF | Fast and easy to useHitachi Service | ConsumablesTutorial | Vulcan | How to measure a sampleAn introduction to Hitachi High-Tech Corporation(Chinese)X-Supreme8000 | Rapid benchtop XRF QA/QC analysis | DemoElectronics | When 1 Nanometer can be the Difference | Coatings XRFPortland / Julie Hopkins - EnglishMetals QA/QC | Read the Metal. Reveal the Quality | XRF, LIBS and OES300 kV in situ SEM/STEM observation of Pt/C catalysts using a Hitachi HF-3300 microscope.Tutorial | X-MET8000 | How to add a gradeFlexSEM 1000: New Camera Navigation "SEM MAP"PMI-MASTER Pro2 – Funkenspektrometer für die mobile Qualitätskontrolle von MetallenFM Expert | Spark OES | Low level nitrogen analysisService | Service AgreementsSolutions for Gigafactories | Analysis EquipmentVulcan | Handheld LIBS | Made to last